A Bayesian EAP-Based Nonlinear Extension of Croon and Van Veldhoven's Model for Analyzing Data from Micro-Macro Multilevel Designs

Author:

Zitzmann, Steffen; Lohmann, Julian F.; Krammer, Georg; Helm, Christoph; Aydin, Burak; Hecht, Martin

Tübinger Autor(en):

Published in:

Mathematics (2022), Bd. 10, H. 5

Verlagsangabe:

Mdpi

Language:

English

Full text:

ISSN:

2227-7390

DDC Classifikation:

510 - Mathematics

Dokumentart:

Article

This item appears in the following Collection(s)